Neutron Diffraction Texture Analysis of Multiphase andLow‐Symmetry Materials Using the Position‐Sensitive DetectorJulios and Peak Deconvolution Methods

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Abstract
Diffraction patterns of multiphase and low-symmetry materials are characterized by a manifold of reflections with high peak overlap, hindering individual pole figure measurements by conventional X-ray technique. These difficulties can be overcome by using neutron diffraction with its advanced position-sensitive detector technology and by separating overlapping peaks by means of profile fitting methods. The paper describes appropriate instrumental equipment and a semi-automatic procedure for individual pole figure data analysis to be performed interactively on a PC. Pole figure results of a two-phase chalcopyrite ore are given.

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