Electrical and optical properties of infrared photodiodes using the InAs/Ga1−xInxSb superlattice in heterojunctions with GaSb

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Abstract
The InAs/Ga1−xInxSb strained‐layer superlattice (SLS) holds promise as an alternative III–V semiconductor system for long wavelength infrared detectors. In this article, we present the first investigation, to the best of our knowledge, of heterojunction photodiodes using this new material. The devices were grown by molecular beam epitaxy on GaSb substrates, and are comprised of a 38 Å InAs/16 Å Ga0.64In0.36Sb SLS used in double heterojunctions with GaSb contact layers. The structures were designed to optimize the quantum efficiency while minimizing transport barriers at the heterointerfaces. The photodiodes are assessed through the correlation of their performance with the SLS material quality and the detector design. X‐ray diffraction, absorption, and Hall measurements are used to determine the SLS material properties. The electrical and optical properties of the photodiodes are determined using current–voltage and spectral responsivity measurements. At 78 K, these devices exhibit rectifying electrical behavior and photoresponse out to a wavelength of 10.6 μm corresponding to the SLS energy gap. The responsivity and resistance in these thin‐layered (0.75 μm), unpassivated photodiodes result in a detectivity of 1×1010 cm √Hz/W at 8.8 μm and 78 K. Based upon the performance of these devices, we conclude that high‐sensitivity operation of long‐wavelength photovoltaic detectors at temperatures well in excess of conventional III–V band gap‐engineered systems, and potentially in excess of HgCdTe, is feasible using this material system.