The Cylindrical Envelope Projection Model Applied to SE Images of Curved Surfaces and Comparison with AFM Evaluations
Open Access
- 1 January 1995
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 6 (5-6) , 513-522
- https://doi.org/10.1051/mmm:1995143
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
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- A model for calculating secondary and backscattered electron yieldsJournal of Microscopy, 1987
- Magnetic Ordering in the Ferromagnetic Rare-Earth MetalsJournal of Applied Physics, 1961