Effect of strain on ADF-STEM high-resolution images
- 1 August 1991
- journal article
- Published by Cambridge University Press (CUP) in Proceedings, annual meeting, Electron Microscopy Society of America
- Vol. 49, 666-667
- https://doi.org/10.1017/s0424820100087641
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- High-resolution incoherent imaging of crystalsPhysical Review Letters, 1990