Reversible Optical Recording Media with Ga-Se-Te System
- 1 July 1985
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 24 (7A) , L504
- https://doi.org/10.1143/jjap.24.l504
Abstract
Reversible optical change in a thin film system of parylene/Te z (Ga x Se1-x )1-z (0.6 ≤z ≤0.9, 0 ≤x ≤0.3)/parylene structure has been studied by measuring reflectance of an optical system focused laser beam to micron-sized spots. Retention time of data written by laser beam is examined under conditions of 50°C and 70% relative humidity. By surface observation with a high resolution SEM, it is found that, as the amount of Ga increases, the retention time is maximal, corresponding to the maximum diameters of microcrystallites with a cylindrical structure.Keywords
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- RAPID REVERSIBLE LIGHT-INDUCED CRYSTALLIZATION OF AMORPHOUS SEMICONDUCTORSApplied Physics Letters, 1971