RECOVERY FROM RADIATION-INDUCED LETHAL SECTORING IN YEAST

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Abstract
Recovery from the X-ray-induced damage responsible for lethal sectoring was investigated in diploid yeast. Lethal sectoring, an important factor in lethal damage, is characterized by the sporadic appearance of clusters of dead cells in earlier post-irradiation vegetative generations of surviving cells. Recovery from the instability responsible for sectoring was evident in a gradual decline in the frequency with which sectors were initiated through successive generations. This decline was shown to result from the fact that unstable cells, though able to persist indefinitely, had a propensity for reversion as well as for lethal sectoring. Some lines of descent from unstable cells lost their ability to revert without losing their ability to produce lethal sectors.

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