Calculation of calibration line parameters from reference material data in the analysis of silicate rocks: Theil's incomplete method compared with least-squares regression
- 5 August 1987
- journal article
- Published by Elsevier in Chemical Geology
- Vol. 63 (3-4) , 345-354
- https://doi.org/10.1016/0009-2541(87)90172-0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Silicate rock analysis by energy-dispersive X-ray fluorescence using a cobalt anode X-ray tube. Part 2. Practical application and routine performance in the determination of chromium, vanadium and bariumJournal of Analytical Atomic Spectrometry, 1987
- Energy‐dispersive x‐ray fluorescence analysis of silicate rocks for major and trace elementsX-Ray Spectrometry, 1984
- Regression methods in the comparison of accuracyThe Analyst, 1982
- Deconvolution and background subtraction by least-squares fitting with prefiltering of spectraAnalytical Chemistry, 1977
- An accurate X-ray spectrographic method for the analysis of a wide range of geological samplesGeochimica et Cosmochimica Acta, 1969