Reversibility of parameter changes of microchannel electron multipliers due to outgassing
- 1 July 1974
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 45 (7) , 927-928
- https://doi.org/10.1063/1.1686770
Abstract
The changes in the gain and strip current characteristics of a microchannel electron multiplier which are caused by outgassing due to ir baking were investigated. Baking at 200°C caused only reversible outgassing. Baking at 250°C for six hours produces irreversible changes. Detailed descriptions of the experimental set up and the controls performed during the baking are given.This publication has 2 references indexed in Scilit:
- The use of a microchannel electron multiplier in spectroscopic instrumentation, involving frequent vacuum breakingReview of Scientific Instruments, 1974
- Long-Term Stability Characteristics of Commonly Used Channel Electron MultipliersIEEE Transactions on Nuclear Science, 1970