Structural and electron diffraction data for sapphire (α‐al2o3)
- 1 January 1985
- journal article
- research article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 2 (3) , 247-258
- https://doi.org/10.1002/jemt.1060020309
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- A tem study of heavy-ion irradiation damage in α-Al2O, with and without helium dopingJournal of Nuclear Materials, 1984
- A computer system for on‐line image capture and analysisJournal of Microscopy, 1982
- Application of Transmission Electron Microscopy to the Study of Deformation in Ceramic OxidesJournal of the American Ceramic Society, 1979
- Slip Systems in Al2O3Journal of the American Ceramic Society, 1973
- Relativistic Hartree–Fock X-ray and electron scattering factorsActa Crystallographica Section A, 1968
- Deformation twinning in corundumPhilosophical Magazine, 1966
- On Miller–Bravais indices and four-dimensional vectorsActa Crystallographica, 1965
- Scattering factors computed from relativistic Dirac–Slater wave functionsActa Crystallographica, 1965
- Refinement of theαAl2O3, Ti2O3, V2O3and Cr2O3structures*Zeitschrift für Kristallographie, 1962
- Plastic deformation of single crystals of sapphire: Basal slip and twinningActa Metallurgica, 1957