X-ray analysis without the need for standards
- 1 September 1976
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 108 (1) , 79-87
- https://doi.org/10.1111/j.1365-2818.1976.tb01081.x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Cross sections for ionization of inner-shell electrons by electronsReviews of Modern Physics, 1976
- Characteristic fluorescence corrections in electron-probe microanalysisBritish Journal of Applied Physics, 1965