Measurement of the thickness of thin films deposited on smooth non-planar substrates.
- 28 February 1978
- journal article
- Published by Elsevier in Optics & Laser Technology
- Vol. 10 (1) , 37-39
- https://doi.org/10.1016/0030-3992(78)90029-4
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Studies on Multiple Beam Interference Fringes Formed on High Order Planes of Localization: Intensity Distribution and the Fringe Shift between Successive Planes of LocalizationOptica Acta: International Journal of Optics, 1965
- Numerical Evaluation of the Intensity Curve of a Multiple-Beam Fizeau FringeJournal of the Physics Society Japan, 1953