Electron Probe Intensity Calculations for 20–50 Kev Electrons
- 1 January 1962
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 33 (1) , 233
- https://doi.org/10.1063/1.1728500
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Effect of Take-Off Angle on Electron Probe CalibrationAnalytical Chemistry, 1961
- Calculation of X-Ray Intensities from Electron Probe SpecimensJournal of Applied Physics, 1961
- New Method for Range Measurements of Low-Energy Electrons in SolidsJournal of Applied Physics, 1959
- Sur les bases physiques de l'analyse ponctuelle par spectrographie XJournal de Physique et le Radium, 1955