Accurate and rapid reduction of experimental x-ray data
- 1 August 1975
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 27 (3) , 123-124
- https://doi.org/10.1063/1.88404
Abstract
An automatic computer method for deriving the intensities, widths, and positions from experimental x‐ray diffraction and energy spectroscopy data is outlined. Complex overlapping clusters of peaks can be resolved and the data are corrected for aberrations.Keywords
This publication has 2 references indexed in Scilit:
- Automatic peak determination in X-ray powder patternsJournal of Applied Crystallography, 1973
- A Simplex Method for Function MinimizationThe Computer Journal, 1965