Magnetic probing depth in spin-polarized secondary electron spectroscopy
- 30 March 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 58 (13) , 1352-1354
- https://doi.org/10.1103/physrevlett.58.1352
Abstract
We have studied the temperature dependence and the sensitivity to oxygen adsorption of the spin polarization of low-energy secondary electrons from Ni(110). Both types of measurements show a strong surface sensitivity, suggesting a mean magnetic probing depth of only three to four atomic layers, contrary to estimates based on the universal escape-depth curve.Keywords
This publication has 14 references indexed in Scilit:
- Theory of Spin-Polarized Secondary-Electron Emission from FerromagnetsPhysical Review Letters, 1986
- Investigations of magnetic microstructures using scanning electron microscopy with spin polarization analysisJournal of Magnetism and Magnetic Materials, 1986
- Oxygen on Fe(100): An Initial-Oxidation Study by Spin-Polarized Auger SpectroscopyPhysical Review Letters, 1985
- Magnetic-structure analysis in scanning electron beam devices by means of the LEED Spin-polarization detectorApplied Physics A, 1985
- Observation of magnetic domains with spin-polarized secondary electronsApplied Physics Letters, 1984
- Evidence for Spin-Dependent Electron-Hole-Pair Excitations in Spin-Polarized Secondary-Electron Emission from Ni(110)Physical Review Letters, 1983
- ESR study of weakly irradiated organic conductors: TMTSF-DMTCNQ and (TMTSF)2PF6Solid State Communications, 1982
- Spin and Energy Analyzed Secondary Electron Emission from a FerromagnetPhysical Review Letters, 1982
- Chemisorption and oxide formation on metals: Oxygen–nickel reactionJournal of Vacuum Science and Technology, 1981
- Electron spin polarization of secondary electrons ejected from magnetized europium oxidePhysics Letters A, 1976