Bias susceptibility measurements in thin permalloy films
- 1 March 1968
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 4 (1) , 39-40
- https://doi.org/10.1109/tmag.1968.1066170
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Susceptibility and Magnetization Ripple in Polycrystalline Magnetic FilmsJournal of Applied Physics, 1968
- Origin of the Periodic Component of Anisotropy Dispersion in Ni-Fe Films IIJapanese Journal of Applied Physics, 1967
- Average Ripple-Angle Magnitude, Wall Pinning, and Susceptibility in Thin Permalloy FilmsJournal of Applied Physics, 1967
- Stray fields in thin magnetic filmsIEEE Transactions on Magnetics, 1966