Resonant ionization of sputtered neutral atoms for trace analysis in high purity materials
- 1 April 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 40-41, 290-292
- https://doi.org/10.1016/0168-583x(89)90981-6
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Trace surface analysis with pico-coulomb ion fluences: Direct detection of multiphoton ionized iron atoms from iron-doped silicon targetsSurface Science, 1984
- Sputter-initiated resonance ionization spectroscopyThin Solid Films, 1983
- Multiphoton resonance ionization of sputtered neutrals: a novel approach to materials characterizationChemical Physics Letters, 1982