A Study of Single Event Upsets in Static RAMS's
- 1 January 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 27 (6) , 1506-1508
- https://doi.org/10.1109/tns.1980.4331060
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Nuclear Reactions in SemiconductorsIEEE Transactions on Nuclear Science, 1980
- Single Event Upset of Dynamic Rams by Neutrons and ProtonsIEEE Transactions on Nuclear Science, 1979