Reverse Monte Carlo simulation for the analysis of EXAFS data

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Abstract
The authors describe the application of the reverse Monte Carlo simulation technique to the analysis of EXAFS data. This technique generates a series of three dimensional particle configurations which are consistent with the experimental EXAFS spectrum. No input information other than the density and the chemical composition of the sample is required. They present initial results for crystalline and amorphous silicon and preliminary results for silver bromide. Since the method works directly from an experimental spectrum it promises to be extremely powerful in modelling the structures of amorphous materials.