Measurement of Minority Carrier Lifetime and Contact Injection Ratio on Transistor Materials
- 1 January 1954
- journal article
- Published by IOP Publishing in Proceedings of the Physical Society. Section B
- Vol. 67 (1) , 9-17
- https://doi.org/10.1088/0370-1301/67/1/303
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Theory of the Forward Characteristic of Injecting Point ContactsProceedings of the Physical Society. Section B, 1953
- Carrier Injection and Extraction in Lead SulphideProceedings of the Physical Society. Section B, 1953
- The Mobility and Life of Injected Holes and Electrons in GermaniumPhysical Review B, 1951
- Measurement of Hole Diffusion in-Type GermaniumPhysical Review B, 1951
- Theory of Relation between Hole Concentration and Characteristics of Germanium Point ContactsBell System Technical Journal, 1950