Structural characterization for epitaxial Fe/Pt(001) multilayer

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Abstract
The structure for the epitaxial Fe/Pt(001) multilayer deposited in an ultrahigh-vacuum chamber is studied using a four-circle x-ray diffractometer. The Fe layer of the multilayer undergoes a structural transition with varying Fe layer thickness. Specular and nonspecular x-ray-diffraction patterns show a strong correlation between the structural transition and disorder. The linewidth of satellite peaks increases with the distance from fundamental reflection. The behavior of the increase becomes pronounced for the Fe layer thickness beyond 12.6 Å. The lateral linewidth is explained by a mosaic structure and correlated roughness. The correlated fluctuation increases with Fe layer thickness. Amplitudes of uncorrelated fluctuation and cumulative fluctuation are small for the Fe layer thickness less than 8.4 Å and increase with Fe layer thickness.