SIMON-A simulator for single-electron tunnel devices and circuits
- 1 September 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 16 (9) , 937-944
- https://doi.org/10.1109/43.658562
Abstract
SIMON is a single electron tunnel device and circuit simulator that is based on a Monte Carlo method. It allows transient and stationary simulation of arbitrary circuits consisting of tunnel junctions, capacitors, and voltage sources of three kinds: constant, piecewise linearly time dependent, and voltage controlled. Cotunneling can be simulated either with a plain Monte Carlo method or with a combination of the Monte Carlo and master equation approach. A graphic user interface allows the quick and easy design of circuits with single-electron tunnel devices. Furthermore, as an example of the usage of SIMON, we discuss the essential problem of random background charge and present possible solutions.Keywords
This publication has 18 references indexed in Scilit:
- Single-electron transistor logicApplied Physics Letters, 1996
- A numerical study of the dynamics and statistics of single electron systemsJournal of Applied Physics, 1995
- Simple and Stable Single-Electron Logic Utilizing Tunnel-Junction LoadJapanese Journal of Applied Physics, 1995
- Simulation of single‐electron logic circuitsElectronics and Communications in Japan (Part II: Electronics), 1994
- Constructions of particular random processesProceedings of the IEEE, 1994
- Single Charge TunnelingPublished by Springer Nature ,1992
- Single Electronics: A Correlated Transfer of Single Electrons and Cooper Pairs in Systems of Small Tunnel JunctionsPublished by Elsevier ,1991
- Virtual electron diffusion during quantum tunneling of the electric chargePhysical Review Letters, 1990
- Macroscopic quantum tunneling of the electric charge in small tunnel junctionsPhysics Letters A, 1989
- Monte Carlo calculations on hot electron energy tailsApplied Physics Letters, 1977