Investigation of Rubber/Metal Bond Failures by Surface-Analysis Techniques

Publisher Website
Google Scholar
Abstract
Surface-analysis techniques including ISS, SIMS, XPS, and SEM are highly complementary and are essential for detailed investigations of rubber/metal bond failures. Multitechnique investigations offer the most effective means of solving problems in bonding applications. EDS, a near-surface analysis technique usually associated with SEM, is a versatile supporting technique for comprehensive studies. Contamination of materials used in bonding applications, especially by silicones, is a commonly encountered factor in bond failures. However, the extent and role of the contamination is often difficult to assess. Prepared test coupons exposed to silicone spray mist considered significant in this study exhibit isolated regions of silicone contamination that did not severely influence peel-test failure modes or maximum peel-load values. The techniques used in this study can be used independently or together to identify surface-treatment effects, determine failure locus, verify the presence of conversion coatings, primers, and adhesives, and identify contaminants in rubber/metal bonding studies. Failure characteristics of bonded assemblies vary and are often complex. Failure investigations of a high-performance mount that exhibits regions of apparent interfacial failure show silicone contamination is present in the failure regions. Intact regions of the same mount failed by fracturing in liquid nitrogen do not contain silicone and show a different failure locus. This suggests that only limited areas of the part were initially contaminated to the extent that bonding was affected; or the regions disbonded in service were exposed to silicone contamination after the failure was initiated.

This publication has 0 references indexed in Scilit: