Determination of diffusion profiles in thin film couples by means of x-ray-diffraction
- 1 July 1975
- journal article
- research article
- Published by Springer Nature in Applied Physics A
- Vol. 7 (3) , 175-179
- https://doi.org/10.1007/bf00936021
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
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- X-Ray Diffraction Study of Interdiffusion in Cu–Ni Powder CompactsJournal of Applied Physics, 1961
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- Intermetallic reactions and ageing effects in thin filmsAdvances in Physics, 1959
- The Effect of Cold-Work Distortion on X-Ray PatternsJournal of Applied Physics, 1950