A note on the analytical absolute stability test

• 1 May 1970
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 58  (5) , 823-824
• https://doi.org/10.1109/PROC.1970.7763

Abstract

Keywords

• STABILITY ANALYSIS
• TESTING
• POLYNOMIALS
• VOLTAGE
• SUFFICIENT CONDITIONS
• Q MEASUREMENT
• NOISE MEASUREMENT
• NOISE LEVEL
• 1F NOISE
• SCATTERING