Design and Structure of an Extended Life High Current Sparkgap
- 1 January 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Plasma Science
- Vol. 7 (3) , 162-163
- https://doi.org/10.1109/TPS.1979.4317222
Abstract
The failure modes of a high-current 100-kA 0.6-C sparkgap were studied. The results of the study were used to design and build a high reliability, high-current sparkgap (130-kA 0.7-C). The structure of the sparkgap and the results of the testing are described.Keywords
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