Abundance and Depth of Origin of Neutral and Ionic Clusters Sputtered from a Liquid Gallium-Indium Eutectic Alloy

Abstract
Neutral and positively charged clusters produced by 4 keV Ar+ ion bombardment of a liquid gallium-indium eutectic alloy have been studied by time-of-flight mass spectrometry coupled with single photon postionization of the neutrals. The abundance distributions for clusters with equal nuclearity are statistical. They confirm a strong indium surface segregation. An increasing gallium content, and, therefore, larger depth of origin, was found for increasing cluster size.

This publication has 20 references indexed in Scilit: