Abundance and Depth of Origin of Neutral and Ionic Clusters Sputtered from a Liquid Gallium-Indium Eutectic Alloy
- 19 September 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 73 (12) , 1719-1722
- https://doi.org/10.1103/physrevlett.73.1719
Abstract
Neutral and positively charged clusters produced by 4 keV ion bombardment of a liquid gallium-indium eutectic alloy have been studied by time-of-flight mass spectrometry coupled with single photon postionization of the neutrals. The abundance distributions for clusters with equal nuclearity are statistical. They confirm a strong indium surface segregation. An increasing gallium content, and, therefore, larger depth of origin, was found for increasing cluster size.
Keywords
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