Ellipsometry of non-uniform anodic oxide films
- 31 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 331-339
- https://doi.org/10.1016/0039-6028(69)90028-4
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- An Ellipsometric Study of Steady-State High Field Ionic Conduction in Anodic Oxide Films on Tantalum, Niobium, and SiliconJournal of the Electrochemical Society, 1966
- A radiotracer study of the composition and properties of anodic oxide films on tantalum and niobiumElectrochimica Acta, 1965
- The Migration of Metal and Oxygen during Anodic Film FormationJournal of the Electrochemical Society, 1965
- Ellipsometric Investigation of the Optical Properties of Anodic Oxide Films on TantalumJournal of the Electrochemical Society, 1964
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- Optical Properties of Anodic Oxide Films on Tantalum, Niobium, and Tantalum + Niobium Alloys, and the Optical Constants of TantalumJournal of the Electrochemical Society, 1961