Microstructure of Thin Single Crystals of Copper
- 1 April 1963
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 34 (4) , 921-923
- https://doi.org/10.1063/1.1729562
Abstract
Single-crystal films of copper of 700–800 Å thickness have been prepared showing high densities of wide stacking faults. Variations in the annealing treatment of the films affect the nature of the imperfections occurring in the film.This publication has 4 references indexed in Scilit:
- The interfacial energy of coherent twin boundaries in copperPhilosophical Magazine, 1961
- Die experimentelle Bestimmung von Stapelfehlerenergien kubisch-flächenzentrierter MetalleThe European Physical Journal A, 1959
- The effect of stacking fault energy on low temperature creep in pure metalsPhilosophical Magazine, 1958
- The structure of oxide films formed on smooth faces of a single crystal of copperActa Metallurgica, 1957