Electron Beam Heating Temperature Profiles in Moderately Thick Cold Stage STEM/SEM Specimens
- 1 May 1978
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 113 (1) , 69-75
- https://doi.org/10.1111/j.1365-2818.1978.tb00095.x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Beam heating of a moderately thick cold stage specimen in the SEM/STEMJournal of Microscopy, 1977
- Prediction of X-Ray Production and Electron Scattering in Electron-Probe Analysis Using a Transport EquationJournal of Applied Physics, 1969
- Multiple scattering of 5-30 keV electrons in evaporated metal films II: Range-energy relationsBritish Journal of Applied Physics, 1964
- The transmission of cathode rays through matterProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1912