Emissive probe current bias method of measuring dc vacuum potential
- 1 February 1988
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 59 (2) , 270-275
- https://doi.org/10.1063/1.1140239
Abstract
It is experimentally demonstrated that, with proper current bias, emissive probes can accurately measure dc electric potential in a vacuum. A comparison is made of the accuracy and time response of this ‘‘vacuum current bias’’ method with two other emissive probe techniques, the inflection point in the limit of zero emission, and the floating potential of a strongly heated probe.Keywords
This publication has 7 references indexed in Scilit:
- Results of the Phaedrus ProgrammeNuclear Fusion, 1985
- Measurement of vacuum space potential by an emissive probeReview of Scientific Instruments, 1984
- Weak double layersPlasma Physics, 1981
- Strong laboratory double layers in the presence of a magnetic fieldPhysics Letters A, 1979
- Inflection-point method of interpreting emissive probe characteristicsReview of Scientific Instruments, 1979
- High Impedance Langmuir ProbesReview of Scientific Instruments, 1968
- Plasma Potential Measurements by Electron Emissive ProbesReview of Scientific Instruments, 1966