Index of refraction of sapphire between 24 and 1060°C for wavelengths of 633 and 799 nm
Open Access
- 1 May 1986
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 3 (5) , 610-616
- https://doi.org/10.1364/josaa.3.000610
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Spectral Nonlinearity Characteristics of Low Noise Silicon Detectors and their Application to Accurate Measurements of Radiant Flux RatiosMetrologia, 1979
- Optical and Infrared Properties of Al_2O_3 at Elevated Temperatures*Journal of the Optical Society of America, 1965
- Refraction and Dispersion of Synthetic SapphireJournal of the Optical Society of America, 1962