Combined atomic force and scanning reflection interference contrast microscopy
- 1 May 1995
- Vol. 17 (3) , 144-147
- https://doi.org/10.1002/sca.4950170304
Abstract
No abstract availableKeywords
This publication has 27 references indexed in Scilit:
- Imaging F-Actin in Fixed Glial Cells with a Combined Optical Fluorescence/Atomic Force MicroscopeNeuroImage, 1993
- Near‐field optical microscopy in transmission and reflection modes in combination with force microscopyJournal of Microscopy, 1993
- Investigation of fabrication parameters for the electron-beam-induced deposition of contamination tips used in atomic force microscopyNanotechnology, 1993
- Imaging optical thicknesses and separation distances of phospholipid vesicles at solid surfacesJournal de Physique II, 1993
- Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscopeLangmuir, 1992
- Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction LimitScience, 1992
- On the measurement of weak repulsive and frictional colloidal forces by reflection interference contrast microscopyLangmuir, 1992
- New scanning tunneling microscopy tip for measuring surface topographyJournal of Vacuum Science & Technology A, 1990
- Dynamic reflection interference contrast (RIC-) microscopy : a new method to study surface excitations of cells and to measure membrane bending elastic moduliJournal de Physique, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986