Definitions and conventions in ellipsometry
- 31 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 14-33
- https://doi.org/10.1016/0039-6028(69)90003-x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Formulas for Using Wave Plates in Ellipsometry*Journal of the Optical Society of America, 1967
- Ellipsometer Study of Anomalous Absorption in Very Thin Dielectric Films on Evaporated Metals*Journal of the Optical Society of America, 1966
- Experimental Determination of the Optical Constants of MetalsJournal of the Optical Society of America, 1965
- OPTICAL PROPERTIES OF SURFACE FILMSAnnals of the New York Academy of Sciences, 1951
- An Optical Investigation of Oxide Films on MetalsJournal of the Optical Society of America, 1939
- Plane waves of lightII Reflection and refractionJournal of the Optical Society of America, 1928
- Plane Waves of LightI Electromagnetic BehaviorJournal of the Optical Society of America, 1927