Rotating Probe Electrometer

Abstract
A new type of scanning electrometer is described which is capable of measuring the charge on areas as small as 0.3 cm2 at a rate fast enough to show changes in charge distribution on a dielectric surface within intervals of the order of 30 msec. The minimum charge density which can be measured is about 0.6×10−9 coulomb cm−2. Resolution of charged areas of the order of one millimeter apart is possible. This provides a new tool for studying the distribution of surface charges in detail.

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