The Determination of X-Ray Diffraction Line Widths
- 1 November 1946
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 70 (9-10) , 679-684
- https://doi.org/10.1103/physrev.70.679
Abstract
The methods which have been suggested for correcting x-ray diffraction line widths for geometrical effects are reviewed. Experimental data are presented for two samples of finely-divided NiO and MgO which show that neither the Warren nor the Jones correction method is valid for these particular specimens. A direct Fourier transform procedure is given which permits calculation of the corrected diffraction line width for all experimental cases.Keywords
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