Photoelectric Measurement of Tungsten Silicide and n-Type Silicon Barriers
- 1 February 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (2) , 899-900
- https://doi.org/10.1063/1.1709446
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Planar Epitaxial Silicon Schottky Barrier DiodesBell System Technical Journal, 1965