Structure in the flicker-noise power spectrum ofn-InSb

Abstract
We have measured the power spectrum of flicker noise in high-purity, single-crystal n-InSb at 76 K in the frequency range 0.1 Hz-10 kHz. The power spectrum can be interpreted as a superposition of two noise spectra. One of them is 1f like at frequencies above a cutoff frequency f0 which is on the order of a few hundred Hz, while at frequencies below f0 it appears to level off to a constant value. The second spectrum is dominant at frequencies well below f0 and behaves as 1f. Noise power much smaller than that predicted by the Hooge relation, SδV=αV2NF, is observed. Also it is found that chemical treatments of the surface have a strong influence on the magnitude of the measured flicker noise.

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