Corrections for the angle dependence of Lorentz polarization and structure factors in X-ray diffraction line profiles
- 1 August 1977
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 10 (8) , 784-785
- https://doi.org/10.1088/0022-3735/10/8/011
Abstract
In accurate line profile analysis, corrections have to be made for the angle dependence of the Lorentz and polarization factors. These corrections should be performed before the deconvolution procedure if the spectral broadening dominates in the instrumental line profile, but after the deconvolution procedure if instrumental factors dominate the instrumental line profile. The different formulae to be applied for the Lorentz-polarization factor are indicated. The correction for the angle dependence of the structure factor should always be performed after the deconvolution procedure.Keywords
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