Thickness measurements of thin foils using alpha particles from 148Gd and 241Am

This publication has 8 references indexed in Scilit:

• Measurement of Stopping Powers for ⁴He, ¹⁶O, and ³⁵Cl ions at ~1 to ~3 MeV per Nucleon in Ni, Ge, Y, Ag, and Au
  Canadian Journal of Physics, 1972
• Special techniques in target preparation for Chalk River nuclear physics experiments
  Nuclear Instruments and Methods, 1972
• Thin film thickness determination by alpha particle backscattering
  Nuclear Instruments and Methods, 1971
• An alpha-particle thickness gauge
  Nuclear Instruments and Methods, 1968
• An application of Rutherford scattering to target thickness measurements
  Nuclear Instruments and Methods, 1968
• Preparation of thin Films, Sources, and Targets
  Annual Review of Nuclear Science, 1962
• Alpha particle thickness gauge using a solid state detector
  Nuclear Instruments and Methods, 1961
• Measurement of surface density of thin foils
  Nuclear Instruments and Methods, 1959