Schottky barrier diodes for low noise mixing in the far infrared

Abstract
Contributions from semiconductor plasma resonance and skin effect to the series resistance of Schottky barrier diodes are incorporated in a calculation of conversion loss for the submillimeter region. The calculation includes both intrinsic and parasitic losses and shows the conversion loss to be strongly dependent upon frequency of operation and upon diode diameter. At higher frequencies mixer performance may be optimized by careful choice of epitaxial carrier concentration and of diode size.

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