Ultrahigh-resolution chemical analysis with the atom probe
- 1 January 1987
- journal article
- research article
- Published by SAGE Publications in International Materials Reviews
- Vol. 32 (1) , 221-240
- https://doi.org/10.1179/imr.1987.32.1.221
Abstract
The atom probe field-ion microscope is a very powerful tool for microstructural and microchemical analysis of a wide range of metallurgical problems at the atomic level. The instrument, its performance, and the types of analyses that may be performed are described. The applications of the technique to metallurgical problems are reviewed.Keywords
This publication has 79 references indexed in Scilit:
- Atomistic study of metastable phases in an Al-3wt.%-Li-0.12wt.%-Zr alloyScripta Metallurgica, 1986
- Site occupation determinations by APFIM for Hf, Fe, and Co in Ni3AlScripta Metallurgica, 1986
- Atom probe field ion microscopy of the decomposition of Cu-2.7at%CoScripta Metallurgica, 1985
- A study of alnico magnets by atom probe field ion microscopyScripta Metallurgica, 1984
- Identification of a B32 metastable precipitate in the FeBe systemScripta Metallurgica, 1984
- Atom probe field ion microscopy of a FeCrCo permanent magnet alloyScripta Metallurgica, 1982
- An atom-probe field-ion microscope for the study of the interaction of impurity atoms or alloying elements with defectsJournal of Nuclear Materials, 1978
- Deuterium depth profiles in metals using imaging field desorptionJournal of Vacuum Science and Technology, 1977
- A time-of-flight atom-probe field-ion microscope for the study of defects in metalsScripta Metallurgica, 1976
- Das FeldionenmikroskopThe European Physical Journal A, 1951