Analysis of a novel ellipsometric technique with special advantages for infrared spectroscopy
- 1 January 1975
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 65 (1) , 25-28
- https://doi.org/10.1364/josa.65.000025
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 14 references indexed in Scilit:
- Design and operation of an automated, high-temperature ellipsometerJournal of the Optical Society of America, 1974
- Fourier transform detection system for rotating-analyzer ellipsometersOptics Communications, 1973
- Optical Measurements on Liquid Metals Using a New EllipsometerJournal of the Optical Society of America, 1968
- A Computer-Operated Following EllipsometerApplied Optics, 1967
- Optical Properties of Nickel and Tungsten and Their Interpretation According to Drude's FormulaPhysical Review B, 1959
- XXVI. Optical constants of metals in the infra-red—experimental methodsJournal of Computers in Education, 1955
- Photoelectric Analysis of Elliptically Polarized LightProceedings of the Physical Society. Section B, 1952
- A New Calculus for the Treatment of Optical SystemsVI Experimental Determination of the Matrix*Journal of the Optical Society of America, 1947
- A New Calculus for the Treatment of Optical SystemsI Description and Discussion of the CalculusJournal of the Optical Society of America, 1941
- A Photoelectric Method for the Determination of the Parameters of Elliptically Polarized LightJournal of the Optical Society of America, 1937