Effect of Dislocations on X-Ray Diffraction Properties of Copper
- 1 November 1970
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 41 (12) , 4783-4789
- https://doi.org/10.1063/1.1658541
Abstract
The effect of dislocations on both integrated intensities and rocking-curve half-widths has been studied in an (n, −n) double-crystal spectrometer arrangement on copper crystals of 103<N<108 dislocations per cm2. The results show that the rocking curve provides a suitable means of characterization of the density and the type of dislocations in this range. The changes in half-width of the rocking curve and the integrated intensity produced by the dislocations can be described satisfactorily by the model of independently scattering perfect crystal blocks up to a dislocation density of 2×105/cm2, and at higher dislocation densities, lattice tilts produced by the dislocations appear to be the main source of line broadening.This publication has 11 references indexed in Scilit:
- Dynamical Diffraction of X Rays by Perfect CrystalsReviews of Modern Physics, 1964
- Growth of Copper Crystals of Low Dislocation DensityJournal of Applied Physics, 1964
- X-Ray Investigation of the Perfection of SiliconJournal of Applied Physics, 1963
- X-ray investigation of the perfection of siliconActa Metallurgica, 1962
- On the Yield Stress of Copper CrystalsJournal of Applied Physics, 1962
- Acid Cutting and Acid Polishing of Copper CrystalsReview of Scientific Instruments, 1961
- X-Ray Integrated Intensity of Germanium Effect of Dislocations and Chemical ImpuritiesJournal of Applied Physics, 1959
- Effect of Dislocations on the Minority Carrier Lifetime in SemiconductorsPhysical Review B, 1956
- The estimation of dislocation densities in metals from X-ray dataActa Metallurgica, 1953
- Intensity of X-ray reflexion from perfect and mosaic absorbing crystalsActa Crystallographica, 1950