Empirical prediction of overall reliability in computer communication networks
- 1 January 1983
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 23 (1) , 137-139
- https://doi.org/10.1016/0026-2714(83)91377-x
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Reliability Indices for Topological Design of Computer Communication NetworksIEEE Transactions on Reliability, 1981