An x-ray spectrometer for Compton scattering
- 1 January 1992
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 63 (1) , 1190-1193
- https://doi.org/10.1063/1.1143079
Abstract
An x‐ray spectrometer has been designed and constructed for Compton scattering measurements using 40–70 keV x‐rays from an ellipsoid multipole wiggler (EMPW) installed in the accumulation ring of the National Laboratory for High Energy Physics at Tsukuba. The spectrometer has four sets of a Cauchois‐type energy analyzer and an imaging plate, which are arranged on the surface of a cone and share a scattering angle of 160°. In each energy‐analyzing system, to increase signal to noise ratio a set of vertical and horizontal slits are inserted between the analyzer and the imaging plate. A resolution of 0.13 a.u. in terms of electron momentum was achieved. A Compton profile of a vanadium single crystal was measured with an integrated counting rate of 400 counts/s.Keywords
This publication has 6 references indexed in Scilit:
- Water-cooled quasi-doubly bent crystal monochromator for Compton scattering experimentsReview of Scientific Instruments, 1991
- Construction of insertion devices for elliptically polarized synchrotron radiationReview of Scientific Instruments, 1989
- An X-ray spectrometer for Compton scattering experiments with synchrotron radiationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1989
- Design and performance of an imaging plate system for X-ray diffraction studyNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- Anisotropic Compton scattering in LiF using synchrotron radiationJournal de Physique, 1980
- X-ray curved-crystal monochromator system at the storage ring DCINuclear Instruments and Methods, 1978