Specification and measurement of the frequency versus temperature characteristics of crystal oscillators
- 13 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Measurement and analysis of thermal hysteresis in resonators and TCXOsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Temperature Compensated Crystal Oscillator Survey and Test ResultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983