Effective Thickness of Bulk Materials and of Thin Films for Internal Reflection Spectroscopy
- 1 November 1966
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 5 (11) , 1739-1743
- https://doi.org/10.1364/ao.5.001739
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Attenuated total reflection spectra from surfaces of anisotropic, absorbing filmsSpectrochimica Acta, 1966
- Electric Field Strengths at Totally Reflecting InterfacesJournal of the Optical Society of America, 1965
- Identification of Trace Amounts of Organophosphorus Pesticides by Frustrated Multiple Internal Reflectance SpectroscopyApplied Spectroscopy, 1965