Evaluation of diffusion parameters in thin film diffusion couples by means of kiessig X-ray interferences
- 1 March 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 32 (2) , 307-310
- https://doi.org/10.1016/0040-6090(76)90319-9
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954