Nanosecond transmission electron microscopy and diffraction
- 1 May 1987
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 20 (5) , 556-557
- https://doi.org/10.1088/0022-3735/20/5/018
Abstract
A conventional TEM was extended to a time-resolving instrument by installing a pulsed microchannel plate as a low-cost time-resolving image detector and a pulsed electron beam shutter. The technique provides electron micrographs and diffraction pictures of non-recurring events on the nanosecond/micrometre scale within a commercial TEM.Keywords
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