The calculation of thin film parameters from spectroscopic ellipsometry data
- 1 December 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 290-291, 40-45
- https://doi.org/10.1016/s0040-6090(96)09009-8
Abstract
No abstract availableThis publication has 29 references indexed in Scilit:
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